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Friday, May 15, 2020 | History

3 edition of CRRES micro--electronics package data analysis found in the catalog.

CRRES micro--electronics package data analysis

E. G. Stassinopoulos

CRRES micro--electronics package data analysis

by E. G. Stassinopoulos

  • 240 Want to read
  • 4 Currently reading

Published by National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, National Technical Information Service, distributor] in [Washington, DC], [Springfield, Va .
Written in English

    Subjects:
  • Radiation.,
  • Dosimeters.

  • Edition Notes

    StatementE.G. Stassinopoulos, G.J. Brucker, C.A. Stauffer.
    SeriesNASA technical paper -- 3423.
    ContributionsBrucker, G. J., Stauffer, C. A., United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL18067584M

    The next IMAPS-UK Webinar is “Micro-Electronics Packaging for Harsh Environments” Monday 20th January @ This is a free to join event – Book your place here This is the fifth in a series . @article{osti_, title = {Test of SEU algorithms against preliminary CRRES satellite data}, author = {McNulty, P J and Beauvais, W J and Abdel-Kader, W G and El-Teleaty, S S and Mullen, E G and Ray, K P}, abstractNote = {The CRRES satellite's highly elliptical orbit exposes the SEU-sensitive devices within the Microelectronics Package .

    Note: If you're looking for a free download links of Microelectronic Circuits: Analysis & Design Pdf, epub, docx and torrent then this site is not for you. only do ebook promotions online . Check Micro Analysis. Lufthansa AG (#) 26 May, LONG-TERM TREND: UP Similarity with the Global Financial Crisis: Global Financial Crisis: During the .

    Electronics Package Reliability and Failure Analysis: A Micromechanics-Based Approach The goal of this chapter is to provide a unified framework for understanding the factors that govern the reliability of electronic : Glenn R. Blackwell. CiteScore: ℹ CiteScore: CiteScore measures the average citations received per document published in this title. CiteScore values are based on citation counts in a given year (e.g. .


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CRRES micro--electronics package data analysis by E. G. Stassinopoulos Download PDF EPUB FB2

Consulted in this study, especially the "CRRES-MEP Flight Data Analysis User's Manual", Version 3, of 21 April (1).

In order to proceed with the analysis, several preparatory activities were necessary, as for example: (i) Specially designed software package was developed to analyze the device SEU data extracted from the CRRES Data. A detailed in-depth analysis was performed on the data from some of the CRRES MEP (Microelectronics Package) devices.

These space flight measurements covered a period of about fourteen months of. Get this from a library. CRRES micro--electronics package data analysis.

[E G Stassinopoulos; G J Brucker; C A Stauffer; United States. National Aeronautics and Space Administration. Scientific and. Microelectronics Failure Analysis Desk Reference, 5th Ed. [Electronic Device Failure Analysis Society, The Electronic Device Failure Analysis Society Desk Reference Committee] on *FREE* shipping on qualifying offers.

Microelectronics Failure Analysis. Stassinopoulos E. G., Brucker G. and Stauffer C. () CRRES micro-electronics package flight data analysis, NASA Technical Paper Stassinopoulos E. G., Brucker G. J., Stauffer C. and Cited by: 1. The Microelectronics Test Package on the CRRES board contained more than 60 device types (Mullen and Ray, ).

In the present paper the analysis of AMD 93L data resulted by (Weatherford et Cited by: 7. For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous () edition.

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Micro Electronics Transistors & IC Data Book Issue 1 Micro Electronics Ltd. c Acrobat 7 Pdf Mb. Scanned by artmisa using Canon DRC +. CRRES micro--electronics package data analysis [microform] / E.G.

Stassinopoulos, G.J. Brucker, C.A. Sta Evaluation of the DOS personal dosimeter [microform] / by Robert F. Holub, Robert F. The book is for both, scientists using the technique as well as those developing new analysis techniques.

Author Bios Frank Emmert-Streib studied physics at the University of Siegen, Germany. In this new volume, renowned authors contribute fascinating, cutting-edge insights into microarray data analysis. Included in this innovative book includes are in-depth looks intopresentations of genomic signal processing, artificial neural network use for microarray data analysis.

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A previous analysis (Petersen ) reported apparently better agreement between AP8MAX-based calculations and the observed CRRES/MEP SEU rates, with an average calculated-to-observed ratio of ~ However, it is now acknowledged that those calculations were misleading, in that they failed to take into account details of the CRRES.

MICROELECTRONIC CIRCUITS: ANALYSIS AND DESIGN combines a ""breadth-first"" approach to teaching electronics with a strong emphasis on electronics design and simulation. Professor Rashid first introduces students to the general characteristics of circuits (ICs) to prepare them for the use of circuit design and analysis /5(2).

Electronics (ISSN ; CODEN: ELECGJ) is an international peer-reviewed open access journal on the science of electronics and its applications published monthly online by MDPI.

The Polish. and standard statistical and econometric software packages for data analysis include ever more sophisticated modeling options. The goal of this book is to familiarize readers with a wide range of. Microelectronics Failure Analysis, Desk Reference, Seventh Edition offers the latest information on advanced failure analysis tools and techniques, illustrated with real-life examples.

This book includes. The Geant4-based Microdosimetry Analysis Tool (GEMAT) is a computer code to study microdosimetry effects of space radiation on micro-electronics and micro-sensors.

The Sector Shielding Analysis. event upsets registered by the Microelectronics Package Experiment on CRRES (see "CRRES Microelectronics Test Package1' by E. Mullen and K. Ray, IEEE Trans. Nuc. Science,) b) Cosmic Ray Model. (Papers 7, 8, 9). The data. CRRES (see Satellite data sources, Environment 96codes) CTS Communications Technology Satellite (), Damage threshold of integrated circuits, illustrative (E.8, Fig.

E-9),Data sources (see Satellite Data .• SID - Serial Input Data Line: The data on this line is loaded into accumulator bit 7 when ever a RIM instruction is executed. • SOD – Serial Output Data Line: The SIM instruction loads the value of bit 7 File Size: 3MB.Master business modeling and analysis techniques with Microsoft Exceland transform data into bottom-line results.

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