CRRES micro--electronics package data analysis

CRRES micro--electronics package data analysis by E. G. Stassinopoulos Download PDF EPUB FB2

Consulted in this study, especially the "CRRES-MEP Flight Data Analysis User's Manual", Version 3, of 21 April (1).

In order to proceed with the analysis, several preparatory activities were necessary, as for example: (i) Specially designed software package was developed to analyze the device SEU data extracted from the CRRES Data. A detailed in-depth analysis was performed on the data from some of the CRRES MEP (Microelectronics Package) devices.

These space flight measurements covered a period of about fourteen months of. Get this from a library. CRRES micro--electronics package data analysis.

[E G Stassinopoulos; G J Brucker; C A Stauffer; United States. National Aeronautics and Space Administration. Scientific and. Microelectronics Failure Analysis Desk Reference, 5th Ed. [Electronic Device Failure Analysis Society, The Electronic Device Failure Analysis Society Desk Reference Committee] on *FREE* shipping on qualifying offers.

Microelectronics Failure Analysis. Stassinopoulos E. G., Brucker G. and Stauffer C. () CRRES micro-electronics package flight data analysis, NASA Technical Paper Stassinopoulos E. G., Brucker G. J., Stauffer C. and Cited by: 1. The Microelectronics Test Package on the CRRES board contained more than 60 device types (Mullen and Ray, ).

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Stassinopoulos, G.J. Brucker, C.A. Sta Evaluation of the DOS personal dosimeter [microform] / by Robert F. Holub, Robert F. The book is for both, scientists using the technique as well as those developing new analysis techniques.

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A previous analysis (Petersen ) reported apparently better agreement between AP8MAX-based calculations and the observed CRRES/MEP SEU rates, with an average calculated-to-observed ratio of ~ However, it is now acknowledged that those calculations were misleading, in that they failed to take into account details of the CRRES.

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The Sector Shielding Analysis. event upsets registered by the Microelectronics Package Experiment on CRRES (see "CRRES Microelectronics Test Package1' by E. Mullen and K. Ray, IEEE Trans. Nuc. Science,) b) Cosmic Ray Model. (Papers 7, 8, 9). The data. CRRES (see Satellite data sources, Environment 96codes) CTS Communications Technology Satellite (), Damage threshold of integrated circuits, illustrative (E.8, Fig.

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